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S452 Microhmmeter 100A

  • 0.01 μΩ resolution for precise low-resistance measurement

  • Maximum test current: 100A

  • Supplied standard resistor for accuracy verification

  • Portable and rugged design for field testing

  • Open-circuit and over-temperature protection

  • Suitable for contact-resistance and high-current connection testing

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Product Description

The Eaglotest S452 is a high-precision micro-ohmmeter designed to measure contact resistance in high-voltage electrical systems. Mechanical wear, thermal cycling, vibration, corrosion and environmental exposure can gradually increase the resistance of electrical contacts and joints. If left undetected, this increased resistance may cause excessive localized heating, equipment damage and unplanned power outages.

The S452 applies a DC test current of up to 100A to provide stable and representative low-resistance measurements. Its four-wire Kelvin measurement method eliminates the influence of test-lead resistance on the result, supporting accurate measurement at the micro-ohm level. The instrument is suitable for testing circuit breakers, switchgear, busbar joints, cable connections, conductors, bonding points and other high-current electrical connections.


Technical FAQ
How should the test current be selected?
Use a current high enough to produce a stable, measurable voltage drop but appropriate for the test object and the applicable test standard. Higher current can improve measurement stability on very low-resistance connections, but it also increases heating and battery consumption. For small components, delicate contacts or repeated testing, a lower current may be more suitable.
Why does the resistance reading change during the test?
The reading may change as the connection stabilizes, surface contamination breaks down or the test object heats under high current. Clean the contact surfaces, ensure that the clamps have firm metal-to-metal contact and keep the voltage-sensing points inside the current-injection points. Use a consistent test duration and allow the test object to cool when comparing repeated high-current measurements.